Office of Technology Commercialization

Duncan, Adam

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Innovations

Innovation Title Categories Lead Inventor
Characterizing Radiation Effects in Integrated Circuits
CRANE-200261
  1. NSWC Crane
  2. Electrical Engineering
Roach, Austin
Device Under Test (DUT) Continuity Test with only Digital Input/Output Structures
CRANE-103032
  1. NSWC Crane
  2. Electrical Engineering
Duncan, Adam
Irreproducible and Re-Emergent Unique Structure or Pattern Identifier Manufacturing and Detection
CRANE-200349
  1. NSWC Crane
  2. Electrical Engineering
Gadlage, Matthew
Combination MOSFET and JFET Operable for Modulating Current Voltage Response or Mitigating Electromagnetic or Radiation Interference Effects by Altering Current Flow through the MOSFETS SCR
CRANE-200114
  1. NSWC Crane
  2. Electrical Engineering
Cole, Patrick L.
Method for Improving the Radiation Tolerance of Floating Gate Memories
CRANE-200321
  1. NSWC Crane
  2. Electrical Engineering
Kay, Matthew
Electronics Test System for Radiation Rich Environments
CRANE-103034
  1. NSWC Crane
  2. Aeronautics
Duncan, Adam
Radiation Hardened Dual Gate Semiconductor Transistor Device with Improved MOSFET and JFET Structures
CRANE-103212
  1. NSWC Crane
  2. Electrical Engineering
Duncan, Adam
Apparatuses and Methods for Implementing Various Physically Unclonable Function (PUF) and Random Number Generator Capabilities
CRANE-200236
  1. NSWC Crane
  2. Electrical Engineering
Duncan, Adam
Image Enhancement Through Algorithmic Acquisition
CRANE-102532
  1. NSWC Crane
  2. Electrical Engineering
Duncan, Adam
Digital Test System
CRANE-101980
  1. NSWC Crane
  2. Electrical Engineering
Duncan, Adam
Improved Radiation Tolerance of Floating Gate Memories
CRANE-103035
  1. NSWC Crane
  2. Electrical Engineering
Kay, Matthew

Details

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