| 2019-SIMP-68382 | |
| Polarization analysis is widely performed in both conventional and nonlinear optical microscopes to provide information on structure and orientation of anisotropic, or directionally dependent, objects within the field of view. Current approaches present unique challenges for retrofitting existing microscopes. Retrofitting is important because it allows for the reusability of currently existing microscopes. Typical polarization-dependent microscopy techniques are either slow, because the user must rotate fixed optics between acquiring each image, or require complex technology that is difficult to retrofit into existing microscopes. Researchers at Purdue University have developed a technology that provides a novel method of polarization modulation for polarization analysis in microscopy. This technology provides a solution to retrofit the capability for polarization analysis into users' existing microscopes. It can be applied to a variety of microscopy techniques including those using visible, near infrared, and infrared light, and this technology is compatible with a variety of contrast mechanisms. This technology has been demonstrated and proven to be compatible with broad classes of microscopic techniques. Advantages: -Can be integrated into existing microscope systems -Faster image acquisition than current solutions Potential Applications: -Polarization-dependent nonlinear optical microscopy -Analysis of crystals prior to X-ray diffraction |
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Dec 13, 2019
Utility Patent
United States
11,042,019
Jun 22, 2021
May 18, 2021
CON-Gov. Funding
United States
(None)
(None)
Dec 17, 2018
Provisional-Patent
United States
(None)
(None)
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Purdue Office of Technology Commercialization The Convergence Center 101 Foundry Drive, Suite 2500 West Lafayette, IN 47906 Phone: (765) 588-3475 Fax: (765) 463-3486 Email: otcip@prf.org |
