Device Under Test (DUT) Continuity Test with only Digital Input/Output Structures

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CRANE-103032
The U.S. Navy seeks a partner for licensing and collaboration on a device under test (DUT) testing system for determining short, open, and good connections using digital input and output (IO) structures in a DUT continuity test through the combined methods of using resistance-capacitance delay, time domain reflectometry, and forcing voltage on to a single IO pin of the DUT while measuring voltage on the remaining IO pins.

Typical device under test (DUT) testing systems rely on analog voltage measurements and adjustable current sources. These systems are limited and fall short of meeting the needs of having a digital system in two ways. First, the current sourcing equipment and analog voltage measurement equipment needs to be built into the test system to complete the measurement. Second, non-standard input and output (IO) structures that do not include an electrostatic discharge diode are not compatible.

NSWC Crane has developed and patented a device under test (DUT) testing system for determining short, open, and good connections using digital input and output (IO) structures in a DUT continuity test through the combined methods of using resistance-capacitance delay, time domain reflectometry, and forcing voltage on to a single IO pin of the DUT while measuring voltage on the remaining IO pins. The system is a computer implemented method for determining electrical connections using digital IO structures without the application of current source and obtaining a precise voltage measurement in the DUT where one short circuit check comprises forcing voltage on a single pin wile measuring voltage on remaining pins and open circuit check comprises of either a) measuring resistance-capacitance delay on DUIT IO or b) using time domain reflectometry or a combination of both.
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Utility Patent
United States
9,684,025
Jun 20, 2017
Purdue Office of Technology Commercialization
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West Lafayette, IN 47906

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