Electronics Test System for Radiation Rich Environments

Back to all technologies
Download as PDF
CRANE-103034
The U.S. Navy seeks a partner for licensing and collaboration on a miniature digital programmable system for use in performing functional tests on digital electronics such as memories, microprocessors, integrated circuits, and analog to digital converters while fitting into a standard 48 pin DIP package footprint.

The testing of digital components is currently performed with large, heavy machines that are not easily transported. Electronics that will be operated in harsh environments, such as radiation rich settings, need to be tested while exposed to real-life operating conditions. It is necessary to test the devices while exposed to these conditions, but it is also imperative that the testing equipment not be exposed which could lead to failure of the test system's components. The smaller the test system, the easier it is to shield and protect. Likewise, testers need to be portable so they can be shipped to environmental testing facilities.

NSWC Crane has developed and patented a compact electronics test system with a programmable interface and on-board functions available for different types of environments. The test system can perform functional tests on digital electronics with 48-pin DIP footprint. The design of the device is inexpensive compared to currently available test system. The small size allows for the device to be shielded from the effects of the environment it is testing as well as makes the device portable.
(None)
Utility Patent
United States
9,594,117
Mar 14, 2017
Purdue Office of Technology Commercialization
1801 Newman Road
West Lafayette, IN 47906

Phone: (765) 588-3475
Fax: (765) 463-3486
Email: otcip@prf.org