Multiple Resonance Ejection at Arbitrary Frequencies in an Ion Trap

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2016-COOK-67398
Modern mass analysis technologies have allowed for powerful new insight into molecular systems using mass spectrometry. In recently years, further advances were made to analyzer design, generating a group of highly effective mass analysis choices. When examining the utility of different mass analyzers toward analysis of a specific sample, multiple factors must be considered. However, despite this wide range of available choices, current mass analysis technologies still have room for improvement. More specific designs can be made to focus on analysis of unique samples, opening even more gateways into molecular systems.

Researchers at Purdue University have developed a method of mass analysis that uses an ion trap at its optimum operating points. Multiple frequencies excite ions for mass analysis, improving the resolution of ion traps by a factor of three. This method can be further applied to standard resonance ejection scan mode most often used to record ion trap mass spectra. Compared to commercial systems, this technology improves mass analysis resolution by an order of magnitude. Marketability of this method provides a more effective solution for trace and highly-specific mass spectrometry analysis.

Advantages:
-High resolution
-Substitute for resonance ejection

Potential Applications:
-Trace chemical and biochemical analysis
-Commercialization
Feb 1, 2017
Utility Patent
United States
9,922,813
Mar 20, 2018

Mar 14, 2018
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United States
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Apr 7, 2016
Provisional-Patent
United States
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Feb 1, 2016
Provisional-Patent
United States
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