Method to Measure the Characteristics in an Electrical Component

Back to all technologies
Download as PDF
The two conventional noncontact methods of mapping the temperature distribution of a planar electronic device are infrared thermal imaging and micro Raman spectroscopy. The Micro-Raman approach provides a greater spatial resolution, and therefore, increased accuracy.

Naval Surface Warfare Center, Crane Division (NSWC Crane), has developed and patented a method of generating function that correlates semiconductor temperature with semiconductor lifetime, including applying resonant frequency laser illumination to semiconductors. This technology is a methodical procedure of detecting the semiconductor and material temperature and estimating its lifetime, and as a result, creates a function that correlates the two characteristics. In addition, this technology has the ability to detect defects in semiconductors.

-Detect defects
-Correlate temperature with lifetime of a semiconductor

Potential Applications:
-Semiconductor industry
Nov 20, 2009
Utility Patent
United States
Dec 16, 2014
Purdue Office of Technology Commercialization
The Convergence Center
101 Foundry Drive, Suite 2500
West Lafayette, IN 47906

Phone: (765) 588-3475
Fax: (765) 463-3486