| CRANE-99763 | |
| The two conventional noncontact methods of mapping the temperature distribution of a planar electronic device are infrared thermal imaging and micro Raman spectroscopy. The Micro-Raman approach provides a greater spatial resolution, and therefore, increased accuracy. Naval Surface Warfare Center, Crane Division (NSWC Crane), has developed and patented a method of generating function that correlates semiconductor temperature with semiconductor lifetime, including applying resonant frequency laser illumination to semiconductors. This technology is a methodical procedure of detecting the semiconductor and material temperature and estimating its lifetime, and as a result, creates a function that correlates the two characteristics. In addition, this technology has the ability to detect defects in semiconductors. Advantages: -Detect defects -Correlate temperature with lifetime of a semiconductor Potential Applications: -Semiconductor industry |
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Nov 20, 2009
Utility Patent
United States
8,911,145
Dec 16, 2014
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Purdue Office of Technology Commercialization 1801 Newman Road West Lafayette, IN 47906 Phone: (765) 588-3475 Fax: (765) 463-3486 Email: otcip@prf.org |