Method to Measure the Characteristics in an Electrical Component

Back to all technologies
Download as PDF
CRANE-99763
The two conventional noncontact methods of mapping the temperature distribution of a planar electronic device are infrared thermal imaging and micro Raman spectroscopy. The Micro-Raman approach provides a greater spatial resolution, and therefore, increased accuracy.

Naval Surface Warfare Center, Crane Division (NSWC Crane), has developed and patented a method of generating function that correlates semiconductor temperature with semiconductor lifetime, including applying resonant frequency laser illumination to semiconductors. This technology is a methodical procedure of detecting the semiconductor and material temperature and estimating its lifetime, and as a result, creates a function that correlates the two characteristics. In addition, this technology has the ability to detect defects in semiconductors.

Advantages:
-Detect defects
-Correlate temperature with lifetime of a semiconductor

Potential Applications:
-Semiconductor industry
Nov 20, 2009
Utility Patent
United States
8,911,145
Dec 16, 2014
Purdue Office of Technology Commercialization
The Convergence Center
101 Foundry Drive, Suite 2500
West Lafayette, IN 47906

Phone: (765) 588-3475
Fax: (765) 463-3486
Email: otcip@prf.org