| 2014-TOMA-66742 | |
| Applications of nanoscale devices with exposure to extreme environments suffer from a lack of characterization methods capable of offering in situ performance measurements. Researchers at Purdue University have developed a technique called spectral tomography to address this issue. This technique uses spatial and temporal non-contact measurements of mechanochemistry in material systems. Predicting mechanical and thermal properties of extreme-scale electronics in high-temperature energy systems, such as nuclear energy and hypersonic air vehicles, measuring thermal cycling and charge-discharge cycle induced dielectric breakdown with corresponding life-cycle failure, e.g., Li-ion battery technology, and transferring in vitro measurements to in vivo measurements/observations are a few of the capabilities of this technology. It offers resolution, temperature, and environment dependence accuracy not currently possible in commercial use. This technology's potential use includes nanoelectronics, alternative energy, and biotechnology. Advantages: -Allows for in situ performance measurements -Transfers in vitro measurements to in vivo measurements/observations -Offers resolution, temperature and environment dependence accuracy Potential Applications: -Nanoelectronics -Alternative Energy -Biotechnology |
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Jul 15, 2015
Utility Patent
United States
9,778,194
Oct 3, 2017
Jul 16, 2014
Provisional-Patent
United States
(None)
(None)
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Purdue Office of Technology Commercialization The Convergence Center 101 Foundry Drive, Suite 2500 West Lafayette, IN 47906 Phone: (765) 588-3475 Fax: (765) 463-3486 Email: otcip@prf.org |
