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| Mass spectroscopy technology for chemical analysis has seen significant advancements in reliability, size, and ease of use; however, methods for direct analysis of gases have lagged. There is an unmet need for improved techniques for direct gas sampling and ionization. Researchers at Purdue University have developed a novel technique for sampling and ionizing gases using synchronous discharge ionization. Pulses of neutral gas are introduced directly into the vacuum chamber of the mass spectrometer. Each pulse that enters the chamber is a constant volume of gas at atmospheric pressure. The ionization source is located inside the vacuum chamber and is pressure sensitive. When the pulse of gas is introduced into the vacuum chamber, pressure in the chamber increases, the ionizer is triggered, and sample ions move on for mass analysis. Following analysis, pressure returns to normal and the machine is ready for another sample. This sampling and ionization technique is compatible with virtually any mass analysis mechanism. Reproducibility of quantitative analysis is improved as a constant volume of atmospheric pressure gas is sampled during each pulse. Advantages: -Compatible with other mass analysis mechanisms -Improved reproducibility of quantitative analysis Potential Applications: -Mass spectrometry |
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Dec 14, 2016
NATL-Patent
United States
9,960,028
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9,129,786
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PCT-Patent
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Provisional-Patent
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(None)
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May 15, 2012
PCT-Patent
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(None)
(None)
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NATL-Patent
European Patent
(None)
(None)
May 20, 2011
Provisional-Patent
United States
(None)
(None)
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Purdue Office of Technology Commercialization 1801 Newman Road West Lafayette, IN 47906 Phone: (765) 588-3475 Fax: (765) 463-3486 Email: otcip@prf.org |