Capacitive Microelectromechanical Switches with Dynamic Soft-Landing

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When a capacitive mechanical switch opens and closes, the electrodes contact the dielectric layer with a given force. A greater landing force increases the probability that the dielectric layer sustains damage and reduces the life of the switch. This is a reliability problem. Current technology utilizes external electrical circuitry to reduce the landing force of the electrode on the dielectric layer.

Researchers at Purdue University have developed a novel method for reducing the landing force for MEMS switches, which does not require circuitry that is external to the switch. Reducing the landing force improves the reliability and extends the life of the switch.

-Reduced land force
-Improved reliability
-Extends life of the switch

Potential Applications:
-Electronic component manufacturers
Oct 13, 2015
United States
Jan 3, 2017

May 7, 2012
Utility Patent
United States
Oct 13, 2015

May 6, 2011
United States
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