Low Temperature Plasma Probe

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Track Code	65050
Categories	Chemistry and Chemical Analysis
Keywords	Chemistry and Chemical Analysis DESI Mass Spectrometry
Public Abstract	Desorption ionization methods are extremely valuable in chemical analysis using mass spectrometry due to their capabilities of generating gas phase analyte ions directly from samples in the condensed phase. Recently developed desorption ionization methods include methods in which the sample is present in the open atmosphere, such as desorption electrospray ionization (DESI), direct analysis in real time (DART), atmospheric pressure dielectric barrier discharge ionization (DBDI), electrospray-assisted laser desorption/ionization (ELDI), and atmospheric-pressure solids analysis probe (ASAP). Some of these methods use active species generated in plasmas for chemical desorption. The gas phase ions formed from the analyte by the active species generated by the low temperature plasma are subsequently mass analyzed by a mass spectrometer. Purdue University researchers have developed a direct current (DC) discharge plasma sustainable with helium at atmospheric pressure for desorption ionization of solids and liquids. An alternating current (AC) direct discharge plasma source has been used for chemical analysis. A plasma pen using pulsed DC has also been developed. In the low temperature plasma probe, a dielectric barrier discharge is used as the plasma source and active species are extracted from the plasma while it is scanned across a surface of interest; at the surface, these active species generate gas phase ions of surface constituents for mass spectrometric analysis. Advantages: -Works with a mini mass spectrometer -Allows for direct analysis of sample Potential Applications: -Chemical analysis
People	Ouyang, Zheng (Project leader) Charipar, Nicholas Cooks, Robert Graham Harper, Jason
Intellectual Property	Application Date Feb 11, 2009 Type NATL-Patent Country of Filing China Patent Number ZL 200980104780.1 Issue Date Nov 25, 2015 Application Date May 14, 2013 Type CON-Patent Country of Filing United States Patent Number 9,064,674 Issue Date Jun 23, 2015 Application Date Aug 26, 2013 Type CON-Patent Country of Filing United States Patent Number 8,772,710 Issue Date Jul 8, 2014 Application Date Jul 21, 2010 Type NATL-Patent Country of Filing United States Patent Number 8,519,354 Issue Date Aug 27, 2013 Application Date Feb 11, 2009 Type PCT-Patent Country of Filing WO Patent Number (None) Issue Date (None) Application Date Feb 11, 2009 Type Country of Filing European Patent Patent Number (None) Issue Date (None) Application Date Feb 12, 2008 Type Provisional-Patent Country of Filing United States Patent Number (None) Issue Date (None)
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